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Home » ECOC 2018: Tektronix shows PAM4 test and debug solutions

ECOC 2018: Tektronix shows PAM4 test and debug solutions

September 27, 2018
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At ECOC 2018, Tektronix showcased its optical test solutions, including:

  • PAM 4 Testing – DSA8300 sampling oscilloscope with an 80GHz optical sampling module showing support for IEEE 802.3bs based 400G optical testing for TDECQ, including new advances in high-sensitivity single-mode/multi-mode optical measurements for NRZ and PAM-4.
  • PAM 4 design and debug– DPO70000SX 70GHz ATI performance oscilloscope analyze single shot PAM-4 signals with live triggering and post-equalized error detection for 400G standards.
  • Complex Coherent testing – an end-to-end demonstration of optical modulation analysis software supporting multi-OMA systems, featuring the AWG70000 Series Arbitrary Waveform Generator and the DPO70000SX oscilloscope for applications such as spatial division multiplexing and more.
  • Support for new emerging standards – 400G ZR Receiver Testing – featuring the Tektronix DPO70000SX 70GHz ATI performance oscilloscope
Tags: Blueprint columnsECOCPAM4TektronixTest
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